On Saturday, 8 March 2025 22:48:29 Greenwich Mean Time Dale wrote:
Frank Steinmetzger wrote:
Am Thu, Feb 20, 2025 at 11:40:48PM +0100 schrieb Frank Steinmetzger:
Another thing to consider: don’t put it into the safe for a year without
powering it up. As was explained in a previous mail, QLC uses sixteen
different levels of charge inside one single flash cell. The chance of a
bit flip increases the longer the SSD is powerless and charge slowly
(very slowly) dissipates. It’s hard to find exact numbers, and it’s more
of a statistical question. Could be a research topic for a slow Sunday.
;-) Also, don’t you live in a hot area?
I knew I’ve seen this data in the past, but couldn’t remeber where and in
what context. I just stumbled upon the relevant info again.
If you search for "jedec temperature and data retention" you find this
PDF:
https://www.jedec.org/sites/default/files/Alvin_Cox%20%5BCompatibility%20M
ode%5D_0.pdf
It contains establised standard values for flash durability. On slide 28
it
says:
Client-class SSDs should retain their data w/o power for 1 year if used
8 hours/day at 40 °C and kept at or below 30 °C when off.
There is also a table for other temperatures; the time is cut in half for
5 degrees more.
Mind you, that PDF is 15 years old, TLS had just been released to the
public one year earlier according to
https://en.wikipedia.org/wiki/Multi-level_cell#Triple-level_cell
-- Grüße | Greetings | Salut | Qapla’ Please do not share anything
from, with or about me on any social network. Some are so convinced,
they don’t even know anymore of what.
That is confusing. Data should be OK for one year without power but
only if powered 8 hours per day. Me scratches my head. Maybe it means
should be OK for a year without power and not sure what to think about
rest.
As I understand it these are two different performance requirements, which
were stipulated in this proposed standard back in 2010.
The first, "Active Use (power on)", describes the level of performance on a
typical client workload and operating environment, 8hrs/day at 40°C. I don't
know if this is controller temperature, NAND flash cell temperature, device
sensor temperature, PC case temperature, or room temperature. The actual
standard document would explain this, as well as the method for measuring it.
Meanwhile, I note my NVMe SSD's sensor tells me the drive is idling at 45.8°C
as I write this. o_O
The second, "Retention Use (power off)", sets a limit of 1 year @30°C.
The FFR and UBER thresholds apply to *both* of the above.